GRASP-X README
GRASP-X, for
Gamma Ray Attenuation & Shielding Parameters-eXtended, is a newly developed web-based code
to calculate a number of gamma-ray shielding parameters.
It calculates various gamma shielding parameters such as
- mass attenuation coefficient (μm),
- half-value layer (HVL),
- tenth-value layer (TVL),
- mean free path (MFP),
- atomic cross section (σa),
- electronic cross section (σe),
- effective atomic number (ZEff), and
- effective electron density (NEff),
based on the energy and mass attenuation data obtained from XCOM.
It is designed to be user-friendly and provides a simple interface for users. The above-mentioned parameters are calculated for a chemical composition given either in mole percent or weight fraction, over the energy range from 1×10⁻³ to 10⁵ MeV. If no minimum or maximum energies are specified, the program uses the default energy range.
At an absorption edge, the program takes the tabulated mass attenuation coefficient (MAC) for the element that actually exhibits the edge. For all other elements in the mixture, which do not have an absorption edge at that energy, the MAC value at the edge is estimated using an exponential fit to three nearby tabulated XCOM values. This approach provides a smooth and physically consistent interpolation for elements whose attenuation curves remain continuous at that energy.
Since some parameters, such as HVL and TVL, require density information, the user must provide a non-zero density value (in g/cm³). If the density is omitted or given as zero, the program will generate an error and stop execution. If a non-zero value is supplied but does not correspond to the true density of the material, GRASP-X will compute the relevant parameters using the provided value, and the user should adjust it if exact results are required.
The results are displayed both as a graph and a downloadable
table.
Please cite the following article if you used GRASP-X in your research:
M. Bektasoglu, I. Karnik, M. Ali Mohammad,
"Investigation of gamma shielding parameters of some silica borotellurite glasses
with different amount of Bi2O2 at energies between 10 and 150 keV",
Radiat. Phys. Chem.,
207, 2023,
110855
https://doi.org/10.1016/j.radphyschem.2023.110855.
Contact: Mehmet Bektasoglu (mehmetb@sakarya.edu.tr)